Thank you very much for your
participation in the 7th Symposium Diagnostics and Yield:
Advanced Silicon Devices and Technologies for ULSI Era. We greatly
appreciate your outstanding contribution in the form of an excellent
invited lecture, as well as competent and informative answers to the
questions asked by the audience, not to mention the relevant and
probing questions that you put to other lecturers.
We highly appreciate you both as
scientists and persons and hope we can count on you to take part in
the 8th Symposium in three years’ time.
